Domain wall pinning in ultra-narrow electromigrated break junctions

Author(s):	Reeve, R. M. and Loescher, A. and Mawass, M.-A. and Hoffmann-Vogel, R. and Kläui, M.
Journal:	{Journal of Physics: Condensed Matter}
Volume:	26
Number (issue):	47
Year:	2014
Publisher:	IOP Publishing

BibTeX Type:	Article (article)

DOI:	10.1088/0953-8984/26/47/474207

Address:	Bristol
Electronic Archiving:	grant_archive
Language:	eng

BibTeX

@article{escidoc:0180,
  title = {{Domain wall pinning in ultra-narrow electromigrated break junctions}},
  journal = {{Journal of Physics: Condensed Matter}},
  volume = {26},
  number = {47},
  publisher = {IOP Publishing},
  address = {Bristol},
  year = {2014},
  author = {Reeve, R. M. and Loescher, A. and Mawass, M.-A. and Hoffmann-Vogel, R. and Kl\"aui, M.},
  doi = {10.1088/0953-8984/26/47/474207}
}