Modern Magnetic Systems
Article
2015
Focused ion beam micromachining enables novel optics for X-ray microscopy
| Author(s): | Keskinbora, K. and Sanli, U. and Grévent, C. and Hirscher, M. and Schütz, G. |
| Journal: | {Microscopy and Microanalysis} |
| Volume: | 21 |
| Number (issue): | Suppl 3 |
| Pages: | 1983--1984 |
| Year: | 2015 |
| Publisher: | Springer-Verlag New York |
| BibTeX Type: | Article (article) |
| DOI: | 10.1017/S1431927615010697 |
| Address: | New York, NY |
| Electronic Archiving: | grant_archive |
| Language: | eng |
BibTeX
@article{escidoc:0114,
title = {{Focused ion beam micromachining enables novel optics for X-ray microscopy}},
journal = {{Microscopy and Microanalysis}},
volume = {21},
number = {Suppl 3},
pages = {1983--1984},
publisher = {Springer-Verlag New York},
address = {New York, NY},
year = {2015},
author = {Keskinbora, K. and Sanli, U. and Gr\'event, C. and Hirscher, M. and Sch\"utz, G.},
doi = {10.1017/S1431927615010697}
}