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Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling. Erratum

2014

Article

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Author(s): Mayer, M. and Keskinbora, K. and Grévent, C. and Szeghalmi, A. and Knez, M. and Weigand, M. and Snigirev, A. and Snigireva, I. and Schütz, G.
Journal: {Journal of Synchrotron Radiation}
Volume: 640
Pages: 640--640
Year: 2014
Publisher: Published for the International Union of Crystallography by Munksgaard

Department(s): Moderne Magnetische Systeme
Bibtex Type: Article (article)

Address: Copenhagen, Denmark
DOI: 10.1107/S1600577514006699
Language: eng

BibTex

@article{escidoc:0192,
  title = {{Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling. Erratum}},
  author = {Mayer, M. and Keskinbora, K. and Gr\'event, C. and Szeghalmi, A. and Knez, M. and Weigand, M. and Snigirev, A. and Snigireva, I. and Sch\"utz, G.},
  journal = {{Journal of Synchrotron Radiation}},
  volume = {640},
  pages = {640--640},
  publisher = {Published for the International Union of Crystallography by Munksgaard},
  address = {Copenhagen, Denmark},
  year = {2014},
  doi = {10.1107/S1600577514006699}
}